- Sustainable
£23.99Plus shipping
ToF-SIMS Ion Mass Spectrometry on Recycled Patch Beanie
- Double-layered knit
- Cotton twill patch for decoration
- Material: 100% polyester (recycled)
- Brand: Beechfield
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| One Size |
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Created by 116840345
ToF-SIMS Ion Mass Spectrometry
Created by 116840345
Show your passion for surface analysis! This design illustrates the ToF-SIMS technology – ideal for physicists, chemists and researchers in the field of nanotechnology and analytics.
Tags: ToF-SIMS, Mass Spectrometry, Spectroscopy, Science, Physics, Chemistry, Laboratory, Surface analysis, Analytics, Scientist, Natural sciences, Molecules, Ions, Physicist, Chemist, Nerd, Geek, Study, University, Technology, Structure elucidation, Materials research, Nanotechnology, Sputtering, Gift
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